Title :
A delta-sigma modulation based BIST scheme for mixed-signal systems
Author :
Huang, Jiun-Lung ; Cheng, Kwung-Ting
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Abstract :
We present the architecture and analysis of a built-in self-test (BIST) scheme that targets mixed-signal system-on-chip (SOC) designs. The basic idea is to employ simple yet high-tolerant digital-to-analog (DA) and analog-to-digital (AD) conversion techniques for on-chip stimulus generation and response acquisition, and to utilize on-chip programmable cores for digital signal processing required for signal synthesis and response analysis. Numerical simulations are conducted to validate the idea and the results demonstrate the effectiveness of this BIST scheme
Keywords :
built-in self test; delta-sigma modulation; integrated circuit testing; mixed analogue-digital integrated circuits; A/D conversion techniques; D/A conversion techniques; SOC designs; built-in self-test; delta-sigma modulation based BIST scheme; digital signal processing; mixed-signal systems; onchip programmable cores; onchip stimulus generation; response acquisition; response analysis; signal synthesis; system-on-chip designs; Built-in self-test; Circuit testing; Computer architecture; Delta modulation; Delta-sigma modulation; Digital modulation; Signal analysis; Signal generators; Transfer functions; Voltage;
Conference_Titel :
Mixed-Signal Design, 2000. SSMSD. 2000 Southwest Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-5975-5
DOI :
10.1109/SSMSD.2000.836463
