• DocumentCode
    1917567
  • Title

    A New Physical Model for the Relaxation in Ferroelectrics

  • Author

    Kühn, C. ; Hönigschmid, H. ; Kowarik, O.

  • Author_Institution
    Universit¨at der Bundeswehr M¨unchen, Neubiberg, Germany
  • fYear
    2000
  • fDate
    11-13 September 2000
  • Firstpage
    164
  • Lastpage
    167
  • Keywords
    Capacitors; Circuit simulation; Ferroelectric materials; Hysteresis; Loss measurement; Polarization; Pulse measurements; Size measurement; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194740
  • Filename
    1503670