• DocumentCode
    1917735
  • Title

    Substrate thermal model reduction for efficient transient electrothermal simulation

  • Author

    Tsai, Ching-Nan ; Kang, Sung-Mo

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    185
  • Lastpage
    190
  • Abstract
    A multiport RC network reduction technique based on congruence transformation was developed specifically for improving the efficiency of temperature calculation in electrothermal simulations. This technique helps reduce the size of the three-dimensional lumped RC network, which is commonly used to model substrate heat conduction, while still preserving the input/output characteristics at the port nodes. A smaller thermal network leads to more efficient substrate temperature calculation. Furthermore, the reduced network can be combined with the device netlist to perform tightly-coupled electrothermal simulation for some cases when the large data size dictates the employment of the more time-consuming relaxation-based temperature calculation method. Our method is applicable to both static and dynamic electrothermal simulations for either localized or large-scale analyses. Runtime improvements in the range of 2×~3× have been achieved in simulations
  • Keywords
    VLSI; circuit simulation; integrated circuit design; integrated circuit modelling; integrated circuit reliability; VLSI; congruence transformation; input/output characteristics; large-scale analyses; multiport RC network reduction technique; runtime improvements; substrate thermal model reduction; thermal network; tightly-coupled electrothermal simulation; transient electrothermal simulation; Analytical models; Circuit simulation; Computational modeling; Computer simulation; Coupling circuits; Electrothermal effects; Equations; Large-scale systems; Reduced order systems; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed-Signal Design, 2000. SSMSD. 2000 Southwest Symposium on
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    0-7803-5975-5
  • Type

    conf

  • DOI
    10.1109/SSMSD.2000.836471
  • Filename
    836471