DocumentCode :
1917864
Title :
Series Resistances of Polysilicon Emitter Bipolar Transistors: Simulation and Measurement
Author :
Dubois, Emmanuel ; Bricout, Paul-Henri ; Robilliart, Etienne
Author_Institution :
IEMN/ISEN UMR CNRS 9929,41, Boulevard Vauban, 59046 Lille Cedex, France
fYear :
1994
fDate :
11-15 Sept. 1994
Firstpage :
169
Lastpage :
172
Keywords :
Bipolar transistors; Charge carrier processes; Contact resistance; Current distribution; Electrical resistance measurement; Electron emission; Frequency; MONOS devices; Silicon; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1994. ESSDERC '94. 24th European
Conference_Location :
Edinburgh, Scotland
Print_ISBN :
0863321579
Type :
conf
Filename :
5435694
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1917864
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