Title :
Performance Characterization of Advanced Interconnects on High Speed VLSI Circuits
Author :
Bermond, Cédric ; Fléchet, Bernard ; Carval, Gilles Le ; Charlet, François ; Morand, Yves ; Angénieux, Gilbert ; Salik, Rachid
Author_Institution :
Universitede Savoie, Le Bourget du Lac, France
fDate :
11-13 September 2000
Keywords :
Crosstalk; Dielectric measurements; Dielectric substrates; Distortion measurement; Frequency; Impedance; Integrated circuit interconnections; Passivation; Propagation constant; Very large scale integration;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194753
