• DocumentCode
    1918004
  • Title

    Integrated scheduling and allocation of high-level test synthesis

  • Author

    Yang, Tianruo ; Peng, Zebo

  • Author_Institution
    Dept. of Comput. & Inf. Sci., Linkoping Univ., Sweden
  • fYear
    1998
  • fDate
    13-16 Sep 1998
  • Firstpage
    81
  • Lastpage
    87
  • Abstract
    This paper presents a high-level test synthesis algorithm for operation scheduling and data path allocation. Data path allocation is achieved by a controllability and observability balance allocation technique which is based on testability analysis at register-transfer level. Scheduling, on the other hand, is carried out by rescheduling transformations which change the default scheduling to improve testability. Contrary to other works in which the scheduling and allocation tasks are performed independently, our approach integrates scheduling and allocation by performing them simultaneously so that the effects of scheduling and allocation on testability are exploited more effectively. Additionally, since sequential loops are widely recognized to make a design hard-to-test, a complete (functional and topological) loop analysis is performed at register-transfer level in order to avoid loop creation during the integrated test synthesis process. With a variety of synthesis benchmarks, experimental results show clearly the advantages of the proposed algorithm
  • Keywords
    VLSI; high level synthesis; integrated circuit testing; logic testing; scheduling; controllability; data path allocation; high-level test synthesis; integrated test synthesis process; loop analysis; observability balance allocation; operation scheduling; register-transfer level; sequential loops; testability analysis; Circuit testing; Costs; High level synthesis; Performance analysis; Performance evaluation; Processor scheduling; Resource management; Scheduling algorithm; Sequential analysis; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Conference 1998. Proceedings. Eleventh Annual IEEE International
  • Conference_Location
    Rochester, NY
  • ISSN
    1063-0988
  • Print_ISBN
    0-7803-4980-6
  • Type

    conf

  • DOI
    10.1109/ASIC.1998.722808
  • Filename
    722808