DocumentCode :
1918154
Title :
800-V Wiring for HVIC Application using Biased Polysilicon Field Plates
Author :
Murray, A.F.J. ; Lane, W.A.
Author_Institution :
Institute of Advanced Microelectronics, National Microelectronics Research Centre, University College, Cork, Ireland.
fYear :
1994
fDate :
11-15 Sept. 1994
Firstpage :
213
Lastpage :
216
Abstract :
Biased polysilicon field plates [1] are used to achieve 800-V wiring in a typical junction isolated, high voltage integrated circuit. The field plates are biased by phosphorous doped polysilicon resistors, connected in a voltage division scheme to the high voltage wire. The effect of using doped (as opposed to undoped), polysilicon resistors on field plate potential distribution is investigated. It is found that a 1.5 ¿m TEOS film is an adequate inter-layer dielectric for 800-V operation.
Keywords :
Dielectrics; Electric breakdown; Integrated circuit interconnections; Microelectronics; Numerical simulation; Resistors; Silicon; Voltage; Wire; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1994. ESSDERC '94. 24th European
Conference_Location :
Edinburgh, Scotland
Print_ISBN :
0863321579
Type :
conf
Filename :
5435704
Link To Document :
بازگشت