Title :
Current-testable high-frequency CMOS operational amplifiers
Author :
Velasco-Medina, J. ; Mir, S. ; Nicolaidis, Michael
Author_Institution :
TIMA/INPG, Grenoble, France
Abstract :
A new test approach for high-frequency operational amplifiers based on current injection is presented in this paper. Current-based test stimuli allow detection of some faults which are difficult to detect or are untestable when conventional voltage-based test stimuli are used. In addition, the selection of test stimuli is simpler since faulty behaviours are observable in the whole frequency band with current injection. An example of a current-testable operational amplifier has been designed, and the small test circuitry required for current injection has a negligible impact on circuit performance
Keywords :
CMOS analogue integrated circuits; fault diagnosis; integrated circuit testing; operational amplifiers; performance evaluation; circuit performance; current injection; current-based test stimuli; faulty behaviour; high-frequency CMOS operational amplifiers; test approach; Circuit faults; Circuit synthesis; Circuit testing; Frequency; Integrated circuit testing; Operational amplifiers; Signal design; System testing; Very large scale integration; Voltage;
Conference_Titel :
ASIC Conference 1998. Proceedings. Eleventh Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-4980-6
DOI :
10.1109/ASIC.1998.722810
