• DocumentCode
    1918351
  • Title

    Cathode Hot Electrons and Anode Hot Holes in Tunneling MOS Capacitors

  • Author

    Palestri, P. ; Selmi, L. ; Sangiorgi, E. ; Pavesi, M. ; Widdershoven, F.

  • Author_Institution
    University of Udine, Italy
  • fYear
    2000
  • fDate
    11-13 September 2000
  • Firstpage
    296
  • Lastpage
    299
  • Keywords
    Anodes; Cathodes; Charge carrier processes; Computational modeling; Degradation; Hot carriers; MOS capacitors; Monte Carlo methods; Predictive models; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194773
  • Filename
    1503703
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1918351