Title :
Cathode Hot Electrons and Anode Hot Holes in Tunneling MOS Capacitors
Author :
Palestri, P. ; Selmi, L. ; Sangiorgi, E. ; Pavesi, M. ; Widdershoven, F.
Author_Institution :
University of Udine, Italy
fDate :
11-13 September 2000
Keywords :
Anodes; Cathodes; Charge carrier processes; Computational modeling; Degradation; Hot carriers; MOS capacitors; Monte Carlo methods; Predictive models; Tunneling;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194773
