Title :
Adaptation of "Drain Current Charge Pumping Technique" for Interface Trap Characterization in Short Channel MOS Transistors
Author :
Fikry, Wael ; Ragheb, Marwa ; Haddara, Hisham
Author_Institution :
Ain Shams University,Cairo, Egypt
fDate :
11-13 September 2000
Keywords :
Analytical models; Charge pumps; Current measurement; Degradation; Electric resistance; Electrical resistance measurement; Frequency; MOSFETs; P-i-n diodes; Parasitic capacitance;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194778
