DocumentCode :
1918528
Title :
A Global Self-Heating Model for Device Simulation
Author :
Grasser, Tibor ; Quay, Ruediger ; Palankovski, Vassil ; Selberherr, Siegfried
Author_Institution :
Vienna University of Technology, Austria
fYear :
2000
fDate :
11-13 September 2000
Firstpage :
324
Lastpage :
327
Keywords :
Area measurement; Boundary conditions; Contacts; Equations; Isothermal processes; Lattices; Microelectronics; Temperature dependence; Temperature distribution; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
Type :
conf
DOI :
10.1109/ESSDERC.2000.194780
Filename :
1503710
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1918528
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