Title :
Logic-compatible embedded NVM for RFID application
Author :
Kuo, C.H. ; Wang, J.C. ; Chih, Yu-Der ; Wang, James ; Yew, T.Y. ; Shyu, Der-Shin ; Huang, Jim ; Liu, Kyle
Author_Institution :
Design Service Div., Taiwan Semicond. Manuf. Co., Ltd., Hsinchu
Abstract :
In this paper, we described the design of logic-process compatible embedded non-volatile memory (NVM) macro for the application of radio frequency identification (RFID). A prototype 1024-bits NVM test chip fabricated by 0.18 mum standard CMOS process is described and characterized. The characterization result shows write power is only 90 uW for write operation and 2 uW @0.5 MHz for read operation. The minimum VCC for read operation can be as low as 0.68 V at -40degC. Macro size of 1024-bits IP is only 0.215 mm2.
Keywords :
CMOS integrated circuits; radiofrequency identification; random-access storage; CMOS process; RFID application; logic-process compatible embedded non-volatile memory; radio frequency identification; size 0.18 mum; CMOS process; Charge pumps; Clocks; Electrons; Logic testing; MOSFETs; Nonvolatile memory; Radio frequency; Radiofrequency identification; Voltage;
Conference_Titel :
Memory Technology, Design and Testing, 2007. MTDT 2007. IEEE International Workshop on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-1656-1
Electronic_ISBN :
1087-4852
DOI :
10.1109/MTDT.2007.4547621
