• DocumentCode
    1918604
  • Title

    2007 IEEE international workshop on memory technology, design, and testing (MTDT’07)

  • fYear
    2007
  • fDate
    3-5 Dec. 2007
  • Firstpage
    72
  • Lastpage
    72
  • Abstract
    The following topics are dealt with: digital memory circuits; memory design and memory circuit testing; system in package; SRAM; nanoscale CMOS; file storage; flash memory.
  • Keywords
    digital storage; integrated circuit design; integrated circuit testing; memory architecture; SRAM; digital memory; file storage; flash memory; memory design; memory testing; nanoscale CMOS; system in package;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design and Testing, 2007. MTDT 2007. IEEE International Workshop on
  • Conference_Location
    Taipei
  • ISSN
    1087-4852
  • Print_ISBN
    978-1-4244-1656-1
  • Type

    conf

  • DOI
    10.1109/MTDT.2007.4547624
  • Filename
    4547624
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1918604