Title :
2007 IEEE international workshop on memory technology, design, and testing (MTDT’07)
Abstract :
The following topics are dealt with: digital memory circuits; memory design and memory circuit testing; system in package; SRAM; nanoscale CMOS; file storage; flash memory.
Keywords :
digital storage; integrated circuit design; integrated circuit testing; memory architecture; SRAM; digital memory; file storage; flash memory; memory design; memory testing; nanoscale CMOS; system in package;
Conference_Titel :
Memory Technology, Design and Testing, 2007. MTDT 2007. IEEE International Workshop on
Conference_Location :
Taipei
Print_ISBN :
978-1-4244-1656-1
DOI :
10.1109/MTDT.2007.4547624
