• DocumentCode
    1919142
  • Title

    The Orientation Dependence of the Piezojunction Effect in Bipolar Transistors

  • Author

    Creemer, J.F. ; French, P.J.

  • Author_Institution
    Delft University of Technology, The Netherlands
  • fYear
    2000
  • fDate
    11-13 September 2000
  • Firstpage
    416
  • Lastpage
    419
  • Keywords
    Bipolar transistors; Compressive stress; Current measurement; Electronics packaging; Instruments; Mechanical factors; Silicon; Stress measurement; Tensile stress; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194803
  • Filename
    1503733
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1919142