Title :
P2–34: Study of field emission from various microstructures of graphene by using anode-probe equipped within scanning electron microscope
Author :
Du, Jiale ; Deng, Shaozhi ; Xu, Ningsheng ; She, Juncong
Author_Institution :
State Key Lab. of Optoelectron. Mater. & Technol., Sun Yat-sen Univ., Guangzhou, China
Abstract :
Increasing interest in field emission from graphene has led us to conduct a detailed investigation into the field emission characteristics of various microstructures of as-grown graphene films. Significant difference in the field emission from different microstructures is found. This can provide guidance to the control growth of graphene films.
Keywords :
crystal microstructure; electron probes; field emission; graphene; scanning electron microscopy; C; P2-34; anode-probe; as-grown graphene films; field emission; graphene microstructures; growth control; scanning electron microscope; Anodes; Current density; Films; Microstructure; Probes; Scanning electron microscopy; Anode probe; Field emission; Graphene; Microstructure;
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2010 23rd International
Conference_Location :
Palo Alto, CA
Print_ISBN :
978-1-4244-7889-7
Electronic_ISBN :
978-1-4244-7888-0
DOI :
10.1109/IVNC.2010.5563132
