DocumentCode
1919151
Title
P2–34: Study of field emission from various microstructures of graphene by using anode-probe equipped within scanning electron microscope
Author
Du, Jiale ; Deng, Shaozhi ; Xu, Ningsheng ; She, Juncong
Author_Institution
State Key Lab. of Optoelectron. Mater. & Technol., Sun Yat-sen Univ., Guangzhou, China
fYear
2010
fDate
26-30 July 2010
Firstpage
185
Lastpage
186
Abstract
Increasing interest in field emission from graphene has led us to conduct a detailed investigation into the field emission characteristics of various microstructures of as-grown graphene films. Significant difference in the field emission from different microstructures is found. This can provide guidance to the control growth of graphene films.
Keywords
crystal microstructure; electron probes; field emission; graphene; scanning electron microscopy; C; P2-34; anode-probe; as-grown graphene films; field emission; graphene microstructures; growth control; scanning electron microscope; Anodes; Current density; Films; Microstructure; Probes; Scanning electron microscopy; Anode probe; Field emission; Graphene; Microstructure;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference (IVNC), 2010 23rd International
Conference_Location
Palo Alto, CA
Print_ISBN
978-1-4244-7889-7
Electronic_ISBN
978-1-4244-7888-0
Type
conf
DOI
10.1109/IVNC.2010.5563132
Filename
5563132
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