• DocumentCode
    1919311
  • Title

    Transient I-V-Characteristics of OLEDs with Deep Traps

  • Author

    Scheinert, S. ; Paasch, G. ; Nguyen, P.H. ; Berleb, S. ; Brütting, W.

  • Author_Institution
    TU Ilmenau, Germany
  • fYear
    2000
  • fDate
    11-13 September 2000
  • Firstpage
    444
  • Lastpage
    447
  • Keywords
    Current measurement; Current-voltage characteristics; Delay; Hysteresis; Indium tin oxide; Leakage current; Organic light emitting diodes; Organic materials; Steady-state; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194810
  • Filename
    1503740