Title :
Evaluation of nonlinearity and complexity in SSTs systems
Author :
El-mezyani, T. ; Wilson, R. ; Leonard, J. ; Edrington, C. ; Srivastava, S. ; Khazraei, M. ; Qin, H. ; Kimball, J. ; Ferdowsi, M.
Author_Institution :
Center for Adv. Power Syst., Florida State Univ., Tallahassee, FL, USA
Abstract :
This paper addresses the complexity and nonlinear dynamics that may arise in solid state transformers (SST). SST in contrast to the conventional transformer is prone to nonlinear and complex dynamics due to incorporation of power electronic (PE) converter and devices. This is because of nonlinear nature, interdependence and coupling, and feedbacks (e.g. control) of these converters. In this paper, the nonlinear and complex behavior of a SST connected to the power grid will be investigated by presenting some test results in normal or extreme operation of system. Then a methodology of complexity quantification will be proposed, which is a refinement of a popular measure called approximate entropy (ApEn). This methodology will be used to interpret some complex behavior of SST system. The detailed model and control scheme of SST including AC/DC rectifier, Dual Active Bridge (DAB) converter and DC/AC inverter are developed to enable dynamic system level simulation.
Keywords :
AC-DC power convertors; DC-DC power convertors; bridge circuits; circuit complexity; control nonlinearities; entropy; invertors; power grids; power transformers; AC-DC rectifier; ApEn; DAB converter; DC-AC inverter; PE converter; PE devices; SST systems; approximate entropy; complexity dynamics; complexity evaluation; dual active bridge converter; dynamic system level simulation; nonlinear dynamics; nonlinearity evaluation; power electronic converter; power electronic devices; power grid; solid state transformers; Circuit faults; Complexity theory; Entropy; Fluctuations; Nonlinear dynamical systems; Rectifiers; Time series analysis; Approximate Entropy; Complexity; Nonlinear dynamics; SSTs; stability;
Conference_Titel :
Systems Conference (SysCon), 2012 IEEE International
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4673-0748-2
DOI :
10.1109/SysCon.2012.6189460