Title :
P2–19: A scheme of uniformity measuring for flat plane cold cathode
Author :
Qin, L. ; Deng, S.Z. ; Xu, N.S. ; Chen, Jun
Author_Institution :
State Key Lab. of Optoelectron. Mater. & Technol., Sun Yat-sen Univ., Guangzhou, China
Abstract :
A luminance-based method was proposed for the emission uniformity characterization of the flat plane cold cathode. A research of relating to new parameters redefining, testing and evaluating was introduced. A comparison was also taken in this paper with the current method.
Keywords :
brightness; cold-cathode tubes; emission uniformity characterization; flat plane cold cathode; luminance-based method; parameter redefining; parameter testing; uniformity measuring; Area measurement; Cathodes; Electron emission; Light sources; Materials; Pixel; Zinc oxide; Field emission uniformity; Flat plane cold cathode; Luminance-based method;
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2010 23rd International
Conference_Location :
Palo Alto, CA
Print_ISBN :
978-1-4244-7889-7
Electronic_ISBN :
978-1-4244-7888-0
DOI :
10.1109/IVNC.2010.5563149
