Title :
P2–12: The field emission behavior of nano-patchwork cathodes
Author :
Binh, Vu Thien ; Mouton, Romain ; Adessi, Christophe ; Semet, Vincent ; Cahay, Marc ; Fairchild, Steven
Author_Institution :
Equipe Emission Electron., Univ. of Lyon 1, Villeurbanne, France
Abstract :
A numerical calculation of the patch-field distribution across nano-patchwork surfaces has been developed. Results show that the low work function nanosize zones are intrinsically protected by an electrostatic screen, which is induced by the surrounding area having higher work function. In presence of an applied field, during field emission, a preferential opening of the surface barrier just over the nano-patches induces a field emission array of parallel e-beams whose geometrical distribution is defined by the positions of the nano-patches.
Keywords :
cathodes; nanostructured materials; numerical analysis; electrostatic screen; field emission behavior; geometrical distribution; low work function nanosize zones; nano-patches; nano-patchwork cathodes; nano-patchwork surfaces; numerical calculation; parallel e-beams; patch-field distribution; Book reviews; Cathodes; Electric potential; Electrostatics; Iron; Materials; Sea surface; field emission; low work-function; patch-field; patchwork cathodes;
Conference_Titel :
Vacuum Nanoelectronics Conference (IVNC), 2010 23rd International
Conference_Location :
Palo Alto, CA
Print_ISBN :
978-1-4244-7889-7
Electronic_ISBN :
978-1-4244-7888-0
DOI :
10.1109/IVNC.2010.5563154