• DocumentCode
    1919656
  • Title

    P2–12: The field emission behavior of nano-patchwork cathodes

  • Author

    Binh, Vu Thien ; Mouton, Romain ; Adessi, Christophe ; Semet, Vincent ; Cahay, Marc ; Fairchild, Steven

  • Author_Institution
    Equipe Emission Electron., Univ. of Lyon 1, Villeurbanne, France
  • fYear
    2010
  • fDate
    26-30 July 2010
  • Firstpage
    145
  • Lastpage
    146
  • Abstract
    A numerical calculation of the patch-field distribution across nano-patchwork surfaces has been developed. Results show that the low work function nanosize zones are intrinsically protected by an electrostatic screen, which is induced by the surrounding area having higher work function. In presence of an applied field, during field emission, a preferential opening of the surface barrier just over the nano-patches induces a field emission array of parallel e-beams whose geometrical distribution is defined by the positions of the nano-patches.
  • Keywords
    cathodes; nanostructured materials; numerical analysis; electrostatic screen; field emission behavior; geometrical distribution; low work function nanosize zones; nano-patches; nano-patchwork cathodes; nano-patchwork surfaces; numerical calculation; parallel e-beams; patch-field distribution; Book reviews; Cathodes; Electric potential; Electrostatics; Iron; Materials; Sea surface; field emission; low work-function; patch-field; patchwork cathodes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2010 23rd International
  • Conference_Location
    Palo Alto, CA
  • Print_ISBN
    978-1-4244-7889-7
  • Electronic_ISBN
    978-1-4244-7888-0
  • Type

    conf

  • DOI
    10.1109/IVNC.2010.5563154
  • Filename
    5563154