DocumentCode

1919696

Title

Switching Behaviour and Noise of Soft Breakdown Current in Ultra-Thin Gate Oxides

Author

Cester, A. ; Paccagnella, A. ; Bandiera, L. ; Ghidini, G.

Author_Institution

Università di Padova, Italy

fYear

2000

fDate

11-13 September 2000

Firstpage

500

Lastpage

503

Keywords

Carbon capture and storage; Current density; Current measurement; Degradation; Electric breakdown; Fluctuations; Frequency; Stress; Telegraphy; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 2000. Proceeding of the 30th European

Print_ISBN

2-86332-248-6

Type

conf

DOI

10.1109/ESSDERC.2000.194824

Filename

1503754