Title :
Application of k-NN based segmentation algorithm in system for automated measurement of surface phenomena
Author :
Sankowski, Dominik ; Strzecha, Krzysztof
Author_Institution :
Comput. Eng. Dept., Tech. Univ. Lodz, Poland
Abstract :
This paper presents the application of a new segmentation algorithm in a computer-based system for high temperature measurements of superficial properties. This newly developed segmentation algorithm is based on statistical pattern recognition theory.
Keywords :
automatic test equipment; high-temperature techniques; image segmentation; pattern recognition; statistical analysis; surface phenomena; temperature measurement; automated measurement; computer-based system; high temperature measurements; k-NN based segmentation algorithm; statistical pattern recognition theory; superficial properties; surface phenomena; Application software; Glass industry; Image converters; Image segmentation; Metals industry; Optical recording; Shape; Solids; Surface tension; Temperature measurement;
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2002. Proceedings of the International Conference
Print_ISBN :
966-553-234-0
DOI :
10.1109/TCSET.2002.1015945
