DocumentCode
1919737
Title
Application of k-NN based segmentation algorithm in system for automated measurement of surface phenomena
Author
Sankowski, Dominik ; Strzecha, Krzysztof
Author_Institution
Comput. Eng. Dept., Tech. Univ. Lodz, Poland
fYear
2002
fDate
2002
Firstpage
239
Lastpage
242
Abstract
This paper presents the application of a new segmentation algorithm in a computer-based system for high temperature measurements of superficial properties. This newly developed segmentation algorithm is based on statistical pattern recognition theory.
Keywords
automatic test equipment; high-temperature techniques; image segmentation; pattern recognition; statistical analysis; surface phenomena; temperature measurement; automated measurement; computer-based system; high temperature measurements; k-NN based segmentation algorithm; statistical pattern recognition theory; superficial properties; surface phenomena; Application software; Glass industry; Image converters; Image segmentation; Metals industry; Optical recording; Shape; Solids; Surface tension; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2002. Proceedings of the International Conference
Print_ISBN
966-553-234-0
Type
conf
DOI
10.1109/TCSET.2002.1015945
Filename
1015945
Link To Document