DocumentCode :
1919739
Title :
Channel Noise Current in Deep Sub-Micron MOSFETs
Author :
Chen, Chih-Hung ; Deen, M. Jamal ; Matloubian, Mishel ; Cheng, Yuhua
Author_Institution :
McMaster University, Hamilton, Ontario, Canada
fYear :
2000
fDate :
11-13 September 2000
Firstpage :
508
Lastpage :
511
Keywords :
CMOS technology; Circuit noise; Integrated circuit noise; Low-frequency noise; MOSFETs; Noise figure; Noise measurement; Radio frequency; Semiconductor device modeling; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
Type :
conf
DOI :
10.1109/ESSDERC.2000.194826
Filename :
1503756
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1919739
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