DocumentCode
1919884
Title
P1–32: Calculation of the enhancement factor for a high-aspect ratio structure
Author
Filip, Lucian D. ; Carey, David J. ; Silva, Ravi
Author_Institution
Adv. Technol. Inst., Univ. of Surrey, Guildford, UK
fYear
2010
fDate
26-30 July 2010
Firstpage
86
Lastpage
87
Abstract
The field enhancement factor for a cylindrically symmetric structure is obtained using an electrostatic model based on a self-validating algorithm. The correct 0 V equipotential line is calculated such that it matches the surface of the given structure.
Keywords
carbon nanotubes; field emission; surface structure; C; carbon nanotube; cylindrically symmetric structure; electrostatic model; equipotential line; field enhancement factor; high-aspect ratio structure; self-validating algorithm; surface structure; voltage 0 V; Cathodes; Electric fields; Electric potential; Electrostatics; Physics; Rough surfaces; Surface roughness; carbon nanotube; field enhancement; self-validation;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference (IVNC), 2010 23rd International
Conference_Location
Palo Alto, CA
Print_ISBN
978-1-4244-7889-7
Electronic_ISBN
978-1-4244-7888-0
Type
conf
DOI
10.1109/IVNC.2010.5563164
Filename
5563164
Link To Document