Title :
Deterministic method of genetic algorithms of test generation for digital systems verification
Author :
Hahanov, Vladimir ; Babich, Anna ; Sokolov, Andrey ; Pudov, Vitaly
Author_Institution :
Comput.-Aided Design Dept., Kharkov Nat. Univ. of Radioelectronics, Ukraine
Abstract :
Models and procedures of test generation for digital systems verification based on genetic algorithms are offered. Program implementation of test generator is oriented to processing of digital circuits with large dimensionality and it combines advantages of genetic algorithms with advantages of deterministic ones.
Keywords :
circuit testing; deterministic algorithms; digital circuits; digital systems; formal verification; genetic algorithms; deterministic algorithm; digital circuit processing; digital system verification; genetic algorithm; test generation; Biological cells; Circuit faults; Circuit testing; Design automation; Digital circuits; Digital systems; Fault detection; Genetic algorithms; Genetic mutations; System testing;
Conference_Titel :
Modern Problems of Radio Engineering, Telecommunications and Computer Science, 2002. Proceedings of the International Conference
Print_ISBN :
966-553-234-0
DOI :
10.1109/TCSET.2002.1015952
