DocumentCode
1920164
Title
Fault analysis of a TMR system using multiple valued logic
Author
Nanduri, S.R. ; El Hakeem, A.K. ; Al-Khalili, A.J.
Author_Institution
Dept. of Electr. & Comput. Eng., Montreal Univ., Que., Canada
fYear
1990
fDate
21-23 Mar 1990
Firstpage
23
Lastpage
29
Abstract
The performance under the stuck at faults is analyzed for circuits using multiple-valued logic and triple modular redundancy (TMR). Three types of faults are specified, and the voter output of the TMR is determined on the basis of the type of fault. The average error per bit of the voter output is determined taking into consideration the type of fault and the signal transmitted. The errors due to Gaussian noise in multivalued logic are also analyzed
Keywords
fault tolerant computing; many-valued logics; performance evaluation; random noise; Gaussian noise; TMR system; multiple valued logic; performance; stuck at faults; triple modular redundancy; voter output; Degradation; Fault tolerance; Fault tolerant systems; Gaussian processes; Hardware; Multivalued logic; Nuclear magnetic resonance; Performance analysis; Redundancy; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computers and Communications, 1990. Conference Proceedings., Ninth Annual International Phoenix Conference on
Conference_Location
Scottsdale, AZ
Print_ISBN
0-8186-2030-7
Type
conf
DOI
10.1109/PCCC.1990.101596
Filename
101596
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