Title :
Fault analysis of a TMR system using multiple valued logic
Author :
Nanduri, S.R. ; El Hakeem, A.K. ; Al-Khalili, A.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Montreal Univ., Que., Canada
Abstract :
The performance under the stuck at faults is analyzed for circuits using multiple-valued logic and triple modular redundancy (TMR). Three types of faults are specified, and the voter output of the TMR is determined on the basis of the type of fault. The average error per bit of the voter output is determined taking into consideration the type of fault and the signal transmitted. The errors due to Gaussian noise in multivalued logic are also analyzed
Keywords :
fault tolerant computing; many-valued logics; performance evaluation; random noise; Gaussian noise; TMR system; multiple valued logic; performance; stuck at faults; triple modular redundancy; voter output; Degradation; Fault tolerance; Fault tolerant systems; Gaussian processes; Hardware; Multivalued logic; Nuclear magnetic resonance; Performance analysis; Redundancy; System testing;
Conference_Titel :
Computers and Communications, 1990. Conference Proceedings., Ninth Annual International Phoenix Conference on
Conference_Location :
Scottsdale, AZ
Print_ISBN :
0-8186-2030-7
DOI :
10.1109/PCCC.1990.101596
