Title :
RF-CMOS Performance Trends
Author :
Woerlee, P.H. ; Langevelde, R. Van ; Montree, A.H. ; Klaassen, D.B.M. ; Tiemeijer, L.F. ; de Vreede, P.W.H.
Author_Institution :
Philips Research Laboratories, Eindhoven, The Netherlands
fDate :
11-13 September 2000
Keywords :
CMOS technology; Cutoff frequency; Electrical resistance measurement; Equations; Fingers; Linearity; MOS devices; Parasitic capacitance; Radio frequency; Semiconductor device modeling;
Conference_Titel :
Solid-State Device Research Conference, 2000. Proceeding of the 30th European
Print_ISBN :
2-86332-248-6
DOI :
10.1109/ESSDERC.2000.194843
