• DocumentCode
    1920186
  • Title

    Wavelet based feature extraction method for breast cancer cytology images

  • Author

    Niwas, Issac ; Palanisamy, P. ; Sujathan, K.

  • Author_Institution
    Dept. of Electron. & Commun. Eng., Nat. Inst. of Technol. (NIT), Tiruchirappalli, India
  • fYear
    2010
  • fDate
    3-5 Oct. 2010
  • Firstpage
    686
  • Lastpage
    690
  • Abstract
    Cancer of the breast is the most common cancer among women. Testing for detection of this cancer involves visual microscopic test of cytology samples such as Fine Needle Aspiration Cytology (FNAC). The result of analysis on this sample by Cyto-pathologist is crucial for breast cancer patient. In this paper, Complex wavelets are employed for multiscale image analysis to extract feature set for the description of Chromatin texture in the cytological diagnosis of invasive breast cancer. Finally, the obtained feature sets are used for training a k-nearest neighbor classifier so that it can classify malignant samples from benign, when given to it in the form of a feature set. The developed automatic classifier has been tested on FNAC samples of benign and malignant cases database and on an average 93.33% successful classification rate has been achieved.
  • Keywords
    cancer; feature extraction; image classification; image texture; medical image processing; patient diagnosis; wavelet transforms; Chromatin texture; FNAC samples; breast cancer cytology images; cancer detection; complex wavelets; cytological diagnosis; cytology samples; cytopathologist; fine needle aspiration cytology; invasive breast cancer; k-nearest neighbor classifier; malignant samples classification; multiscale image analysis; visual microscopic test; wavelet based feature extraction method; Breast cancer; Filter bank; Wavelet analysis; Wavelet transforms; Benign and Malignant breast cells; Chromatin analysis; Complex wavelet transforms; Microscopic image; k-nn classifier;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics & Applications (ISIEA), 2010 IEEE Symposium on
  • Conference_Location
    Penang
  • Print_ISBN
    978-1-4244-7645-9
  • Type

    conf

  • DOI
    10.1109/ISIEA.2010.5679377
  • Filename
    5679377