• DocumentCode
    1920237
  • Title

    Dependence of Channel Width and Length on MOSFET Matching for 0.18 um CMOS Technology

  • Author

    Difrenza, R. ; Llinares, P. ; Ghibaudo, G. ; Robillart, E. ; Granger, E.

  • Author_Institution
    STMicroelectronics, Crolles Cedex, France
  • fYear
    2000
  • fDate
    11-13 September 2000
  • Firstpage
    584
  • Lastpage
    587
  • Keywords
    CMOS technology; Decorrelation; Linear predictive coding; Linear regression; MOS devices; MOSFET circuits; Measurement standards; Research and development; Threshold voltage; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2000. Proceeding of the 30th European
  • Print_ISBN
    2-86332-248-6
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2000.194845
  • Filename
    1503775
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1920237