Title :
Effect of core shell morphology on dielectric properties of Zr doped BaTiO3
Author :
Armstrong, T.R. ; Roseman, R.D. ; Buchanan, R.C.
Author_Institution :
Dept. of Mater. Sci., Illinois Univ., Urbana, IL, USA
fDate :
30 Aug-2 Sep 1992
Abstract :
The core-shell grains and lattice structure in Zr-modified BaTiO 3 were characterized. Through TEM (transmission electron microscopy), CBED (convergent-beam electron diffraction), and EDS (dispersive X-ray spectroscopy) techniques, the shells were identified as diffuse regions of pseudocubic structure surrounding a tetragonal BaTiO3 core. Grain morphology and developed internal stresses in BaTiO3-based high dielectric materials are shown to be a dominant factor in the development and stability of the high dielectric properties. Core-shell grains were formed in BaTiO3 with ZrO 2 doping, upon sintering in the range 1300°C-1320°C. A diffused boundary phase led to high internal stresses, suppression of Tc, a distribution of Curie points, and a flattened permittivity peak. The internal stress was found to be an accurate basis for estimating the permittivity response to temperature. The stability of these highly stressed samples was also found to be improved as the concentration of core-shell grains increased. Under controlled processing parameters, therefore, significantly enhanced dielectric properties can be achieved
Keywords :
X-ray chemical analysis; barium compounds; crystal morphology; dielectric losses; ferroelectric Curie temperature; internal stresses; lattice constants; permittivity; sintering; transmission electron microscope examination of materials; zirconium; 1300 to 1320 C; BaTiO3:Zr; CBED; Curie point distribution; EDS technique; TEM; convergent-beam electron diffraction; core shell morphology; core-shell grains; dielectric properties; diffused boundary phase; dispersive X-ray spectroscopy; grain morphology; internal stresses; lattice structure; permittivity peak; permittivity response; processing parameters; pseudocubic structure; sintering; transmission electron microscopy; Dielectrics; Dispersion; Internal stresses; Lattices; Morphology; Permittivity; Stability; Transmission electron microscopy; X-ray diffraction; Zirconium;
Conference_Titel :
Applications of Ferroelectrics, 1992. ISAF '92., Proceedings of the Eighth IEEE International Symposium on
Conference_Location :
Greenville, SC
Print_ISBN :
0-7803-0465-9
DOI :
10.1109/ISAF.1992.300593