Title :
Charge Pumping of Single Interface Traps in Submicron MOSFET´s
Author :
Groeseneken, G. ; De Wolf, L. ; Bellens, R. ; Maes, H.E.
Author_Institution :
IMEC, Kapeldreef 75, 3001 Leuven, Belgium.
Abstract :
Charge pumping of single interface traps in small area MOSFET´s is demonstrated for the first time. The dependence of the single trap charge pumping current on the base level voltage is described. Also the creation of one single interface trap under influence of low level hot carrier injection is demonstrated. The correlation with RTS-noise experiments is discussed.
Keywords :
Charge pumps; Electron traps; Equations; Frequency measurement; Geometry; Hot carrier injection; MOSFET circuits; Photonic band gap; Pulse measurements; Threshold voltage;
Conference_Titel :
Solid State Device Research Conference, 1994. ESSDERC '94. 24th European
Conference_Location :
Edinburgh, Scotland
