Title :
Maintenance of Serviceability of Various Perspective Semiconductor Devices at Radiation Influence
Author :
Korshunov, F.P. ; Bogatyrev, Yu.V. ; Belous, A.I. ; Shwedov, S.V. ; Golubev, N.F. ; Lastovsky, S.B. ; Kulgachev, V.I.
Author_Institution :
NAS of Belarus, Minsk
Abstract :
The results of experimental researches, methods of prediction and increase of radiation resistance of logic CMOS integrated microcircuits, MOS memory microcircuits - electrically erasable programmable read only memories (EEPROM), and also insulated gate bipolar transistors (IGBT) are presented.
Keywords :
CMOS integrated circuits; CMOS logic circuits; EPROM; insulated gate bipolar transistors; integrated memory circuits; radiation effects; IGBT; MOS memory microcircuits; electrically erasable programmable read only memories EEPROM; insulated gate bipolar transistors; logic CMOS integrated microcircuits; radiation influence; radiation resistance; semiconductor devices; serviceability maintenance; Semiconductor devices;
Conference_Titel :
Microwave & Telecommunication Technology, 2007. CriMiCo 2007. 17th International Crimean Conference
Conference_Location :
Crimea
Print_ISBN :
978-966-335-012-7
DOI :
10.1109/CRMICO.2007.4368888
