• DocumentCode
    1920504
  • Title

    Radiation Effects in Microwave Semiconductor Devices

  • Author

    Gromov, D.V.

  • Author_Institution
    Specialized Electron. Syst., Moscow
  • fYear
    2007
  • fDate
    10-14 Sept. 2007
  • Firstpage
    655
  • Lastpage
    656
  • Abstract
    The basic radiation effects in microwave semiconductor devices are presented in this paper. A comparative analysis of radiation hardness is carried out for the microwave transistors and diodes.
  • Keywords
    microwave diodes; microwave transistors; radiation hardening (electronics); microwave diodes; microwave semiconductor devices; microwave transistors; radiation hardness; Gallium arsenide; Microwave devices; Microwave transistors; P-i-n diodes; PIN photodiodes; Radiation effects; Semiconductor devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave & Telecommunication Technology, 2007. CriMiCo 2007. 17th International Crimean Conference
  • Conference_Location
    Crimea
  • Print_ISBN
    978-966-335-012-7
  • Type

    conf

  • DOI
    10.1109/CRMICO.2007.4368889
  • Filename
    4368889
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1920504