DocumentCode
1920763
Title
7.4: Dose control circuits for digitally addressable VACNF based maskless lithography
Author
Eliza, Sazia A. ; Islam, Syed K. ; Rahman, Touhidur ; Bull, Nora D. ; Blalock, Benjamin J. ; Baylor, Larry R. ; Ericson, Milton N. ; Gardner, Walter L.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
fYear
2010
fDate
26-30 July 2010
Firstpage
109
Lastpage
110
Abstract
This paper presents dose control electronics and a digital addressing method for the vertically aligned carbon nanofiber (VACNF) based massively parallel maskless e-beam lithography system. The Digital Electrostatically focused e-beam Array direct-write Lithography (DEAL) developed by our research group in Oak Ridge National Laboratory incorporates digitally addressable field emission arrays (DAFEAs) of the VACNFs which function as the lithography heads during the exposure of the resist. A logic and memory control circuit (LMC) and a dose control circuit (DCC) have been designed to write a desired pattern and control the dose of electrons, respectively. This paper summarizes our previous works on different versions of the DCCs designed and optimized in the effort of obtaining a fixed and optimum dosage with the smaller circuit area.
Keywords
carbon nanotubes; electron beam lithography; logic circuits; storage management chips; C; digital addressable VACNF method; digital addressable field emission arrays; digital electrostatic focused e-beam array direct-write lithography; digital electrostatically focused e-beam array; dose control circuits; dose control electronics; electron dose; logic circuit; massive parallel maskless e-beam lithography system; memory control circuit; vertical aligned carbon nanofiber; Arrays; Carbon dioxide; Delay; Laboratories; Lithography; Resists; USA Councils; Dose Control Circuit; Maskess Lithography; Vertically Aligned Carbon Nanofiber;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference (IVNC), 2010 23rd International
Conference_Location
Palo Alto, CA
Print_ISBN
978-1-4244-7889-7
Electronic_ISBN
978-1-4244-7888-0
Type
conf
DOI
10.1109/IVNC.2010.5563200
Filename
5563200
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