Title :
On the Origin of the 1/f
Author :
Lukyanchikova, N. ; Petrichuk, M. ; Garbar, N. ; Simoen, E. ; Mercha, A. ; van Meer, H. ; Meyer, K. De ; Claeys, C.
Author_Institution :
Institute of Semiconductor Physics, Kiev, Ukraine
fDate :
24-26 September 2002
Keywords :
1f noise; Circuit noise; Frequency; Low-frequency noise; MOSFET circuits; Noise level; Semiconductor device noise; Silicon on insulator technology; Thermal resistance; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
DOI :
10.1109/ESSDERC.2002.194874