Title :
Investigation of the Thermal Noise of MOS Transistors under Analog and RF Operating Conditions
Author :
Brederlow, Ralf ; Wenig, Georg ; Thewes, Roland
Author_Institution :
Infineon Technologies, Munich, Germany
fDate :
24-26 September 2002
Keywords :
Circuit noise; Circuit simulation; Impedance measurement; MOSFETs; Noise measurement; Performance evaluation; Radio frequency; Resistors; Semiconductor device modeling; Testing;
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
DOI :
10.1109/ESSDERC.2002.194877
