DocumentCode
1921009
Title
Investigation of the Thermal Noise of MOS Transistors under Analog and RF Operating Conditions
Author
Brederlow, Ralf ; Wenig, Georg ; Thewes, Roland
Author_Institution
Infineon Technologies, Munich, Germany
fYear
2002
fDate
24-26 September 2002
Firstpage
87
Lastpage
90
Keywords
Circuit noise; Circuit simulation; Impedance measurement; MOSFETs; Noise measurement; Performance evaluation; Radio frequency; Resistors; Semiconductor device modeling; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN
88-900847-8-2
Type
conf
DOI
10.1109/ESSDERC.2002.194877
Filename
1503807
Link To Document