DocumentCode
1921023
Title
Design and parametric analysis of 32nm OPAMP in CMOS and CNFET technologies for optimum performance
Author
Usmani, Fahad Ali ; Hasan, Mohammad
Author_Institution
Dept. of Electron. Eng., Aligarh Muslim Univ. Aligarh, Aligarh, India
fYear
2009
fDate
1-2 Oct. 2009
Firstpage
87
Lastpage
92
Abstract
There is a need to explore emerging technologies based on carbon nanotube electronics as the CMOS technology is approaching its limits. This will help in quick commercialization of these promising technologies. This paper presents the design, performance analysis and comparison of a carbon nanotube FET (CNFET) based OPAMP with bulk CMOS for 32 nm technology node. The CNFET based OPAMP is optimized in terms of operating voltage, diameter and pitch of the carbon nanotubes along with the qualitative explanation of the obtained results using HSPICE. Furthermore, comparison of CNFET design with planar CMOS for same on chip area occupancy shows the superiority of the former in terms of 210% increase in Gain, settling time reduction by 45%, power reduction equal to 81% and extremely good noise performance for low power-low bandwidth applications depending upon the selection of the CNT diameter. Additionally, we propose an optimal design of the output stage of CNFET OPAMP by lowering the inter-nanotube distance (pitch) while keeping the width of the CNFET constant for better slewing performance. Furthermore, comparison between two technologies for same GBP performance has also been investigated.
Keywords
CMOS integrated circuits; carbon nanotubes; field effect transistors; operational amplifiers; CMOS technology; CNFET OPAMP; CNFET based OPAMP; CNFET constant; CNT diameter; carbon nanotube FET; carbon nanotube electronics; carbon nanotubes; chip area occupancy; internanotube distance; low power-low bandwidth application; noise performance; optimum performance; parametric analysis; planar CMOS; power reduction; settling time reduction; Carbon Nanotube (CNT); ballistic; chirality; nanoelectronics; nanowires; scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro-Nanoelectronics, Technology and Applications, 2009. EAMTA 2009. Argentine School of
Conference_Location
San Carlos de Bariloche
Print_ISBN
978-1-4244-4835-7
Electronic_ISBN
978-9-8725-1029-9
Type
conf
Filename
5288891
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