TLP: ESD models correlation and aproximation

There are several models which try to describe the waveforms and damage produced by an electrostatic discharge event -ESD- to an integrated circuit-IC-, or more generally to a semiconductor device-SD-. The transmission line pulse-TLP-test is widely used to run tests in this field, so it is needed to keep close correlation to the models used in different standards, in order to validate its results. This work analyzes the search of an approximate correlation, through tests, measurements and PSpice simulation, in order to predict, through the use of TLP information, the results of applying different standard ESD waveforms to a device under test-DUT-.