Title :
Understanding nMOSFET Characteristics after Soft Breakdown and Their Dependence on the Breakdown Location
Author :
Kaczer, B. ; Degraeve, R. ; Crupi, F. ; Keersgieter, A. De ; Groeseneken, G.
Author_Institution :
IMEC, Leuven, Belgium
fDate :
24-26 September 2002
Keywords :
Electric breakdown; Electrons; Equations; FETs; Immune system; Insulation; MOSFET circuits; Medical simulation; Medical tests; Stress;
Conference_Titel :
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN :
88-900847-8-2
DOI :
10.1109/ESSDERC.2002.194889
