Title :
Design of an image-type dielectric resonator to measure surface resistance of a high-T/sub c/ superconductor film
Author :
Kobayashi, Y. ; Hashimoto, T.
Author_Institution :
Dept. of Electr. & Electron. Syst., Saitama Univ., Urawa, Japan
Abstract :
A new measurement method using two resonant modes, the TE/sub 021/ and TE/sub 012/ modes, in an image-type dielectric resonator is proposed to measure the surface resistance R/sub s/ of a high-T/sub c/ superconductor (HTS) film and the loss tangent tan/spl delta/ of a sapphire rod separately, precisely and nondestructively. A sapphire resonator is set in a cavity constructed from two HTS films and a copper cylinder. This resonator structure is designed from the mode charts calculated on the basis of the rigorous analysis by the mode matching method. It is verified that the mode chart also is effective to identify many resonant modes observed in measurement. The temperature dependence of R/sub s/ of a YBCO film was measured at 20 GHz by this method. The measured result agrees very well with one by the conventional two-resonator method.
Keywords :
dielectric resonators; electric resistance measurement; high-temperature superconductors; microwave measurement; sapphire; superconducting thin films; 20 GHz; Al/sub 2/O/sub 3/; Cu cylinder; HTS films; TE/sub 012/ mode; TE/sub 021/ mode; YBCO film; YBaCuO; high-T/sub c/ superconductor film; image-type DR design; image-type dielectric resonator; loss tangent measurement; mode chart; mode matching method; resonant modes; sapphire resonator; sapphire rod; surface resistance measurement; temperature dependence; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electrical resistance measurement; High temperature superconductors; Loss measurement; Resonance; Superconducting films; Surface resistance; Tellurium;
Conference_Titel :
Microwave Symposium Digest, 2001 IEEE MTT-S International
Conference_Location :
Phoenix, AZ, USA
Print_ISBN :
0-7803-6538-0
DOI :
10.1109/MWSYM.2001.966939