• DocumentCode
    1921415
  • Title

    Design of an image-type dielectric resonator to measure surface resistance of a high-T/sub c/ superconductor film

  • Author

    Kobayashi, Y. ; Hashimoto, T.

  • Author_Institution
    Dept. of Electr. & Electron. Syst., Saitama Univ., Urawa, Japan
  • Volume
    1
  • fYear
    2001
  • fDate
    20-24 May 2001
  • Firstpage
    495
  • Abstract
    A new measurement method using two resonant modes, the TE/sub 021/ and TE/sub 012/ modes, in an image-type dielectric resonator is proposed to measure the surface resistance R/sub s/ of a high-T/sub c/ superconductor (HTS) film and the loss tangent tan/spl delta/ of a sapphire rod separately, precisely and nondestructively. A sapphire resonator is set in a cavity constructed from two HTS films and a copper cylinder. This resonator structure is designed from the mode charts calculated on the basis of the rigorous analysis by the mode matching method. It is verified that the mode chart also is effective to identify many resonant modes observed in measurement. The temperature dependence of R/sub s/ of a YBCO film was measured at 20 GHz by this method. The measured result agrees very well with one by the conventional two-resonator method.
  • Keywords
    dielectric resonators; electric resistance measurement; high-temperature superconductors; microwave measurement; sapphire; superconducting thin films; 20 GHz; Al/sub 2/O/sub 3/; Cu cylinder; HTS films; TE/sub 012/ mode; TE/sub 021/ mode; YBCO film; YBaCuO; high-T/sub c/ superconductor film; image-type DR design; image-type dielectric resonator; loss tangent measurement; mode chart; mode matching method; resonant modes; sapphire resonator; sapphire rod; surface resistance measurement; temperature dependence; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electrical resistance measurement; High temperature superconductors; Loss measurement; Resonance; Superconducting films; Surface resistance; Tellurium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2001 IEEE MTT-S International
  • Conference_Location
    Phoenix, AZ, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-6538-0
  • Type

    conf

  • DOI
    10.1109/MWSYM.2001.966939
  • Filename
    966939