DocumentCode
1921641
Title
Improved Ruggedness of a High Current Vertical Power Dmos
Author
Kim, M.J. ; Mukherjee, S. ; Young, J.C.
Author_Institution
Philips Laboratories, North American Philips Corporation, N.Y.
fYear
1991
fDate
17-19 June 1991
Keywords
Automotive engineering; Avalanche breakdown; Boron; Circuits; Dielectric substrates; Implants; Industrial control; Intelligent vehicles; Laboratories; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 1991. 49th Annual
Conference_Location
Boulder, CO, USA
Print_ISBN
0-87942-647-0
Type
conf
DOI
10.1109/DRC.1991.664675
Filename
664675
Link To Document