• DocumentCode
    1921711
  • Title

    Monte Carlo Simulation of Program and Erase Charge Distributions in NROM(TM) Devices

  • Author

    Ingrosso, Gianluca ; Selmi, Luca ; Sangiorgi, Enrico

  • Author_Institution
    DIEGM, University of Udine, Italy
  • fYear
    2002
  • fDate
    24-26 September 2002
  • Firstpage
    187
  • Lastpage
    190
  • Keywords
    Analytical models; Channel hot electron injection; Charge carrier processes; Electron traps; Fabrication; Heating; Monte Carlo methods; Nonvolatile memory; Physics; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
  • Print_ISBN
    88-900847-8-2
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2002.194901
  • Filename
    1503831
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1921711