• DocumentCode
    1921745
  • Title

    11.3: Electron emission from hafnium carbide

  • Author

    Mackie, William A. ; Magera, Gerald G.

  • Author_Institution
    Appl. Phys. Technol., Inc., McMinnville, OR, USA
  • fYear
    2010
  • fDate
    26-30 July 2010
  • Firstpage
    211
  • Lastpage
    212
  • Abstract
    HfC was evaluated as a cold field emission source. Single crystal HfC was produced and fabricated into cold field emitters, then angular intensity and reduced brightness were determined from experimental I(V) data. Energy distribution data were in agreement with a theoretical model. The reduced brightness, energy distribution, and emission stability are compared to commercially available sources which show that HfC produced a higher brightness and a lower energy spread than a W cold field source or a ZrO/W Schottky emitter. HfC maintains its emission level for one hour in moderate UHV condition; a dramatic improvement over the stability of W. This combined with a durability that allows for frequent flash cleaning without degradation of the emitter end form make HfC a highly promising source. We compared stability and noise to emission from a tungsten tip at the same angular intensity. By increasing the emitter temperature slightly, stability is improved while maintaining a low energy spread.
  • Keywords
    brightness; electron field emission; hafnium compounds; HfC; Schottky emitter; angular intensity; cold field emission source; cold field emitters; electron emission; emission stability; energy distribution data; flash cleaning; Brightness; Circuit stability; Hybrid fiber coaxial cables; Probes; Stability analysis; Temperature sensors; Thermal stability; carbide; electron source; field emission cathode; hafnium carbide; high brightness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2010 23rd International
  • Conference_Location
    Palo Alto, CA
  • Print_ISBN
    978-1-4244-7889-7
  • Electronic_ISBN
    978-1-4244-7888-0
  • Type

    conf

  • DOI
    10.1109/IVNC.2010.5563231
  • Filename
    5563231