DocumentCode
1922001
Title
Distributed t-way test suite data generation using exhaustive search method with map and reduce framework
Author
Soh, Zainal Hisham Che ; Abdullah, Syahrul Afzal Che ; Zamli, Kamal Zuhairi ; Younis, Mohammed I.
Author_Institution
Fac. of Electr., Eng., Univ. Teknol. MARA, Shah Alam, Malaysia
fYear
2010
fDate
3-5 Oct. 2010
Firstpage
340
Lastpage
344
Abstract
In this paper, a new distributed algorithm for generating test suite for t-way testing utilizing a shared tuple space server as transport layer between master and worker is presented. The design of the algorithm is based on the Map and Reduce software framework implemented using tuple space technology. The proposed algorithm requires listing all the possible interaction elements into all partitioned space to ensure maximum interaction coverage in all partition. The exhaustive test cases is generated and loaded into their respective partition using hash based routing algorithm. The final test suite is produced from a reduced the test case obtained from the worker calculation on maximum interaction coverage. An encouraging simulation result is obtained on effectiveness of using the tuple space technology to parallelize the test suite generation on single machine and multi machine for different input parameter.
Keywords
program testing; search problems; distributed t-way test suite data generation; exhaustive search method; map and reduce software framework; shared tuple space server; Algorithm design and analysis; Partitioning algorithms; Software algorithms; Software systems; Space technology; Testing; Workstations; Combinatorial Interaction Testing; Map and Reduce; Tuple Space Technology; Worker-Master Design Pattern;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics & Applications (ISIEA), 2010 IEEE Symposium on
Conference_Location
Penang
Print_ISBN
978-1-4244-7645-9
Type
conf
DOI
10.1109/ISIEA.2010.5679443
Filename
5679443
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