Title :
A remote laboratory for debugging FPGA-based microprocessor prototypes
Author :
Pastor, Javier Sanchez ; Gonzalez, Ivan ; Lopez, Jorge ; Gomez-Arribas, Francisco ; Martinez, Javier
Author_Institution :
Departamento de Indenieria Informatica, Univ. Autonoma de Madrid, Spain
fDate :
30 Aug.-1 Sept. 2004
Abstract :
In this paper, a framework for testing microprocessor prototypes is presented. A RISC microprocessor is designed by students using VHDL language and adapted to be implemented on a FPGA device. The correct behaviour of the designed microprocessor is checked executing test programs written and compiled by the students for this microprocessor. Using a Web client, users send test programs and a file with the design to a remote laboratory where it is loaded on a real FPGA device. A set of tools for debugging the remote execution of the tests has been developed, using a graphical interface similar to other debugging tools. Groups of selected students of a computer architecture course have participated in this experience. The good opinions received from the students, suggest the incorporation of this remote laboratory experience in the next regular course.
Keywords :
Internet; computer aided instruction; computer debugging; educational courses; electronic engineering education; field programmable gate arrays; graphical user interfaces; integrated circuit testing; logic CAD; logic testing; microprocessor chips; student experiments; FPGA device; FPGA-based microprocessor prototype; RISC microprocessor; VHDL language; Web client; computer architecture course; computer debugging; debugging tools; graphical interface; microprocessor checking; microprocessor testing; remote laboratory; students; test program compiling; test program writing; Computer architecture; Debugging; Field programmable gate arrays; Hardware design languages; Microprocessors; Prototypes; Reduced instruction set computing; Remote laboratories; Software prototyping; Testing;
Conference_Titel :
Advanced Learning Technologies, 2004. Proceedings. IEEE International Conference on
Print_ISBN :
0-7695-2181-9
DOI :
10.1109/ICALT.2004.1357380
