DocumentCode :
1922516
Title :
Improved large-signal model and model extraction procedure for InGaP/GaAs HBTs under high-current operations
Author :
Cherepko, S.V. ; Shirokov, M.S. ; Hwang, J.C.M. ; Brandstaedter, A.
Author_Institution :
Lehigh Univ., Bethlehem, PA, USA
Volume :
2
fYear :
2001
fDate :
20-24 May 2001
Firstpage :
671
Abstract :
Improved large-signal as well as improved model extraction procedure is proposed for InGaP/GaAs HBTs under high-current operations. The model comprises physics-based differential equations that are implemented through symbolically defined devices in a commercially available circuit simulator. Other model improvements include bilateral logical correlation with small-signal characteristics, and additional series resistance with the base-emitter diffusion capacitance. The improvement in extraction procedure is mainly based on a fixed intrinsic vs. extrinsic base-collector capacitance ratio at low currents, whereas a fixed intrinsic base resistance at high currents. Experimentally it has been verified that the as-extracted model without numerical optimization closely predicts the RF power performance of the HBTs.
Keywords :
III-V semiconductors; S-parameters; equivalent circuits; gallium arsenide; heterojunction bipolar transistors; indium compounds; microwave bipolar transistors; microwave power transistors; power bipolar transistors; semiconductor device models; DC model; Gummel plot; HBT; InGaP-GaAs; RF power performance; S parameters; additional series resistance; base-emitter diffusion capacitance; bilateral logical correlation; equivalent circuit; fixed intrinsic base resistance; high-current operation; improved large-signal model; model extraction procedure; physics-based differential equations; small-signal characteristics; symbolically defined devices; Capacitance; Electrical resistance measurement; Equivalent circuits; Gallium arsenide; Heterojunction bipolar transistors; Identity-based encryption; Radio frequency; Semiconductor device modeling; Temperature dependence; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2001 IEEE MTT-S International
Conference_Location :
Phoenix, AZ, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-6538-0
Type :
conf
DOI :
10.1109/MWSYM.2001.966983
Filename :
966983
Link To Document :
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