• DocumentCode
    1922531
  • Title

    Photo-CVD of ferroelectric Pb(Zr,Ti)O3 thin films

  • Author

    Katayama, Takuma ; Sugiyama, Masataka ; Shimizu, Masaru ; Shiosaki, Tadashi

  • Author_Institution
    Dept. of Electron., Kyoto Univ., Japan
  • fYear
    1992
  • fDate
    30 Aug-2 Sep 1992
  • Firstpage
    336
  • Lastpage
    339
  • Abstract
    Pb(Zr,Ti)O3 thin films were grown by the photo-CVD (chemical vapor deposition) method using Pb(C2H5) 4, Zr(O-t-C4H9)4, Ti(O-i-C 3H7)4, and O2. In this growth system, both tetragonal Pb(Zr,Ti)O3 films and rhombohedral Pb(Zr,Ti)O3 films were obtained, and the (111)-orientation of the tetragonal films was affected by the photoirradiation. It is also shown that the photoprocess enhanced the reactions involving the Zr precursors and that this enhancement caused compositional changes and an increase in growth rates. Some electrical properties of the films, which are related to the ferroelectric memory device characteristics, are also examined
  • Keywords
    ceramics; chemical vapour deposition; dielectric hysteresis; ferroelectric switching; ferroelectric thin films; lead compounds; permittivity; PZT ferroelectric thin films; PbZrO3TiO3; dielectric constant; ferroelectric hysteresis; ferroelectric memory device; ferroelectric switching; photo-CVD; rhombohedral films; tetragonal films; Ferroelectric materials; Light sources; Plasma temperature; Semiconductor films; Semiconductor thin films; Sputtering; Substrates; Transistors; X-ray diffraction; Zirconium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 1992. ISAF '92., Proceedings of the Eighth IEEE International Symposium on
  • Conference_Location
    Greenville, SC
  • Print_ISBN
    0-7803-0465-9
  • Type

    conf

  • DOI
    10.1109/ISAF.1992.300701
  • Filename
    300701