DocumentCode
1922656
Title
Monitoring Flash EEPROM Reliability by Equivalent Cell Analysis
Author
Ielmini, Daniele ; Spinelli, Alessandro S. ; Lacaita, Andrea L. ; Gubello, Massimiliano ; Van Duuren, Michiel J.
Author_Institution
DEI - Politecnico of Milano, Italy
fYear
2002
fDate
24-26 September 2002
Firstpage
359
Lastpage
362
Keywords
Area measurement; Current measurement; Degradation; EPROM; Leakage current; Monitoring; Nonvolatile memory; Statistical distributions; Stress measurement; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference, 2002. Proceeding of the 32nd European
Print_ISBN
88-900847-8-2
Type
conf
DOI
10.1109/ESSDERC.2002.194943
Filename
1503873
Link To Document