مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1922840

Title :

Coulomb Blockade in Thin SOI Nanodevices

Author :

Fraboulet, D. ; Jehl, X. ; Mariolle, D. ; Le Royer, C. ; Le Carval, G. ; Scheiblin, P. ; Rivallin, P. ; Mollard, L. ; Deleroyelle, D. ; Nier, M.E. ; Toffoli, A. ; Molas, G. ; De Salvo, B. ; Deleonibus, S. ; Sanquer, M.

Author_Institution :

CEA-LETI, Grenoble, France

fYear :

2002

fDate :

24-26 September 2002

Firstpage :

395

Lastpage :

398

Keywords :

Conductivity; Electrons; Etching; Fabrication; Geometry; MOSFET circuits; Quantum dots; Resists; Silicon; Wires;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Solid-State Device Research Conference, 2002. Proceeding of the 32nd European

Print_ISBN :

88-900847-8-2

Type :

conf

DOI :

10.1109/ESSDERC.2002.194951

Filename :

1503881

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1922840