Non-destructive real-time monitor to measure 3D-bunch charge distribution with spectral decoding EO-sampling

Author

Tomizawa, Hiroyuki ; Okayasu, Y. ; Matsubara, S. ; Togashi, T. ; Ogawa, Koichi ; Matsukawa, T. ; Minamide, Hiroaki

Author_Institution

Japan Synchrotron Radiat. Res. Inst., Sayo, Japan

fYear

2013

fDate

12-16 May 2013

Firstpage

1

Lastpage

1

Abstract

Since 2010 at SPring-8, we have been demonstrating a seeded free-electron laser (FEL) in the extreme ultra violet (EUV) region by high-order harmonics (HH) generation from an external laser source in a prototype test accelerator (EUV-FEL) [1]. In FEL seeding as a full-coherent high-intensive light source for EUV user experiments, a high hit rate of successfully seeded FEL pulses is required. Precise measurements of the electron bunch charge distribution (BCD) and its arrival timing are crucial keys to maximize and keep three-dimensional (3D: spatial and temporal) overlapping between the HH pulse and the electron bunch.

Keywords

electro-optical effects; free electron lasers; laser variables measurement; optical harmonic generation; optical pulse generation; particle beam bunching; 3D-bunch charge distribution measurements; EUV region; EUV-FEL; electro-optic sampling; electron bunch charge distribution measurements; external laser source; extreme ultraviolet region; full-coherent high-intensive light source; high-order harmonic generation; nondestructive real-time monitor; prototype test accelerator; seeded FEL pulses; seeded free-electron laser; spectral decoding EO-sampling; three-dimensional overlapping; Crystals; Free electron lasers; Laser feedback; Measurement by laser beam; Monitoring; Real-time systems; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Europe (CLEO EUROPE/IQEC), 2013 Conference on and International Quantum Electronics Conference

Conference_Location

Munich

Print_ISBN

978-1-4799-0593-5

Type

conf

DOI

10.1109/CLEOE-IQEC.2013.6801232

Filename

6801232