DocumentCode

1923255

Title

Reliability and Retention Study of Nanocrystal Cell Array

Author

Gerardi, C. ; Ammendola, G. ; Melanotte, M. ; Lombardo, S. ; Crupi, I.

Author_Institution

STMicroelectronics, Catania, Italy

fYear

2002

fDate

24-26 September 2002

Firstpage

475

Lastpage

478

Keywords

CMOS technology; Dielectrics; Electrons; Nanocrystals; Physics; Research and development; Robustness; Silicon compounds; Threshold voltage; Tunneling;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 2002. Proceeding of the 32nd European

Print_ISBN

88-900847-8-2

Type

conf

DOI

10.1109/ESSDERC.2002.194971

Filename

1503901